{"id":30463,"date":"2026-04-24T09:05:32","date_gmt":"2026-04-24T08:05:32","guid":{"rendered":"https:\/\/piseo.fr\/?p=30463"},"modified":"2026-04-24T10:09:28","modified_gmt":"2026-04-24T09:09:28","slug":"non-linear-optical-metrology-bench","status":"publish","type":"post","link":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/","title":{"rendered":"Non-linear optical metrology bench"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\"><strong>Industrializing advanced photonic metrology<\/strong><\/h2>\n\n\n\n<h2 class=\"wp-block-heading\">How PIS\u00c9O transforms a laboratory setup into reliable industrial equipment for Non-Destructive Testing<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">In the semiconductor and integrated photonics industries, a component\u2019s final performance depends directly on the quality of the material used. When a crystal defect is detected too late, after costly manufacturing steps, the industrial losses become irrecoverable.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Identifying these defects early on is therefore a major strategic challenge. However, this requires a measurement system capable of moving beyond the experimental framework to become a reliable, reproducible and usable tool in an industrial environment.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">It is precisely at this critical juncture, the transition from scientific proof to industrial equipment, that PIS\u00c9O adds value.<\/p>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-3335a4e is-style-plain\" data-block-id=\"3335a4e\"><style>.stk-3335a4e {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-1bc6ef0 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"1bc6ef0\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-1bc6ef0-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-1bc6ef0-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-f8845be\" data-block-id=\"f8845be\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-4f79889\" id=\"the-real-challenge-transforming-a-scientific-method-into-an-industrial-tool\" data-block-id=\"4f79889\"><h2 class=\"stk-block-heading__text\">The real challenge: Transforming a scientific method into an industrial tool<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-ba4fc06\" data-block-id=\"ba4fc06\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-ba4fc06\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-ba-4-fc-06-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-ba-4-fc-06-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-5bc15ec stk-block-accordion__content\" data-v=\"4\" data-block-id=\"5bc15ec\"><style>.stk-5bc15ec-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-5bc15ec-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-5bc15ec-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-3f706f9\" data-block-id=\"3f706f9\"><p class=\"stk-block-text__text\">Description de ce bloc. Utilisez cet espace pour d\u00e9crire votre bloc. N\u2019importe quel texte fera l\u2019affaire.\nDescription de ce bloc. Vous pouvez utiliser cet espace pour d\u00e9crire votre bloc.<\/p><\/div>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-b16d3ec is-style-plain\" data-block-id=\"b16d3ec\"><style>.stk-b16d3ec {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-6446808 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"6446808\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-6446808-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-6446808-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-f933bbf\" data-block-id=\"f933bbf\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-ce874d1\" id=\"ensuring-the-qualification-of-strategic-photonic-materials\" data-block-id=\"ce874d1\"><h2 class=\"stk-block-heading__text\">Ensuring the qualification of strategic photonic materials<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-e940428\" data-block-id=\"e940428\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-e940428\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-e-940428-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-e-940428-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-2e3d331 stk-block-accordion__content\" data-v=\"4\" data-block-id=\"2e3d331\"><style>.stk-2e3d331-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-2e3d331-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-2e3d331-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-22abeff\" data-block-id=\"22abeff\"><p class=\"stk-block-text__text\">The test bench developed enables the non-destructive characterization of advanced materials used in integrated photonics, particularly lithium niobate (LiNbO?), a material essential for electro-optical and nonlinear devices.<\/p><\/div>\n\n\n\n<p class=\"wp-block-paragraph\">The objective is clear: to have a tool capable of qualifying the material in order to support informed industrial decision-making.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The system thus enables:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Mapping of crystal quality,<\/li>\n\n\n\n<li>Detection of dislocations and anisotropies,<\/li>\n\n\n\n<li>Qualification of substrates up to 300 mm,<\/li>\n\n\n\n<li>Reduction of technological and financial risks prior to industrialization.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The bench thus becomes a true industrial decision-making tool, enabling rapid validation of material compliance before committing to critical production stages.<\/p>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-e92253d is-style-plain\" data-block-id=\"e92253d\"><style>.stk-e92253d {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-a1ebe1e stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"a1ebe1e\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-a1ebe1e-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-a1ebe1e-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-1574e12\" data-block-id=\"1574e12\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-e3ce4c7\" id=\"metrology-based-on-nonlinear-reflectometry\" data-block-id=\"e3ce4c7\"><h2 class=\"stk-block-heading__text\">Metrology based on nonlinear reflectometry<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-689a41a\" data-block-id=\"689a41a\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-689a41a\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-689-a-41-a-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-689-a-41-a-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-7672cde stk-block-accordion__content\" data-v=\"4\" data-block-id=\"7672cde\"><style>.stk-7672cde-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-7672cde-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-7672cde-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-1385ac9\" data-block-id=\"1385ac9\"><p class=\"stk-block-text__text\">The solution is based on an advanced nonlinear reflectometry technique that utilizes second harmonic generation (SHG).<\/p><\/div>\n\n\n\n<p class=\"wp-block-paragraph\">The material is illuminated with an infrared femtosecond laser and the optical response generated at twice the fundamental frequency is analyzed. The observed variations, combined with the analysis of polarization states, reveal signatures directly linked to the crystalline structure.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Unlike conventional optical approaches, this method allows for the detection of invisible structural defects while remaining completely non-destructive.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"576\" src=\"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-1024x576.png\" alt=\"\" class=\"wp-image-30465\" srcset=\"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-1024x576.png 1024w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-300x169.png 300w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-768x432.png 768w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-1536x864.png 1536w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-150x84.png 150w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-600x338.png 600w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-696x392.png 696w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-1392x783.png 1392w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre-1068x601.png 1068w, https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/EN_schema-reflectometre.png 1920w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-2d34961 is-style-plain\" data-block-id=\"2d34961\"><style>.stk-2d34961 {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-c4830c9 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"c4830c9\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-c4830c9-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-c4830c9-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-cd1664d\" data-block-id=\"cd1664d\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-5b94100\" id=\"the-key-to-performance-precision-opto-mechanical-architecture\" data-block-id=\"5b94100\"><h2 class=\"stk-block-heading__text\">The key to performance: Precision opto-mechanical architecture<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-a779873\" data-block-id=\"a779873\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-a779873\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-a-779873-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-a-779873-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-c54c28d stk-block-accordion__content\" data-v=\"4\" data-block-id=\"c54c28d\"><style>.stk-c54c28d-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-c54c28d-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-c54c28d-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-92b4c41\" data-block-id=\"92b4c41\"><p class=\"stk-block-text__text\">While performance relies on beam physics, its reproducibility depends primarily on the opto-mechanical design.<\/p><\/div>\n\n\n\n<p class=\"wp-block-paragraph\">Grazing incidence, micrometric focusing and the detection of extremely weak signals demand exceptional mechanical and thermal stability. The slightest displacement or drift compromises metrological validity.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">PIS\u00c9O has therefore designed a complete architecture integrating:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>A high-power femtosecond laser (~2 W),<\/li>\n\n\n\n<li>Micrometric beam shaping and focusing,<\/li>\n\n\n\n<li>Custom opto-mechanical assemblies guaranteeing rigidity and long-term alignment,<\/li>\n\n\n\n<li>Multi-axis motorized stages ensuring sub-micrometric positioning,<\/li>\n\n\n\n<li>A high-sensitivity detection chain based on a photomultiplier tube (PMT) and strict spectral filtering.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The manufacturing of these sub-assemblies involves a network of partners specializing in precision machining, selected and managed by PIS\u00c9O. This comprehensive mastery of opto-mechanical design and integrated automation provides a decisive competitive advantage, ensuring system stability throughout extended measurement campaigns.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Without this stability, reliable industrial operation is impossible.<\/p>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-6701ba3 is-style-plain\" data-block-id=\"6701ba3\"><style>.stk-6701ba3 {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-f5e978e stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"f5e978e\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-f5e978e-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-f5e978e-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-51c090c\" data-block-id=\"51c090c\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-4e5bfc4\" id=\"system-engineering-designed-for-industrial-use\" data-block-id=\"4e5bfc4\"><h2 class=\"stk-block-heading__text\">System engineering designed for industrial use<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-d30c26c\" data-block-id=\"d30c26c\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-d30c26c\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-d-30-c-26-c-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-d-30-c-26-c-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-aea1223 stk-block-accordion__content\" data-v=\"4\" data-block-id=\"aea1223\"><style>.stk-aea1223-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-aea1223-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-aea1223-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-ce784c5\" data-block-id=\"ce784c5\"><p class=\"stk-block-text__text\">The difference between an experimental device and industrial equipment lies not in the components used but in the system engineering that connects them.<\/p><\/div>\n\n\n\n<p class=\"wp-block-paragraph\">Every design choice was made with the entire test bench in mind to ensure:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Operator safety,<\/li>\n\n\n\n<li>Long-term reliability,<\/li>\n\n\n\n<li>Maintainability,<\/li>\n\n\n\n<li>Metrological repeatability.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">The integration of a Class 4 laser source illustrates this approach: energy density calculations, optical sizing, management of ultrashort pulses, and the integration of control devices enable safe operation in an industrial environment.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">The system thus maintains its performance during mapping operations involving several hundred measurement points taken over several hours, without alignment drift or signal degradation.<\/p>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-a2308d1 is-style-plain\" data-block-id=\"a2308d1\"><style>.stk-a2308d1 {border-style:solid !important;border-color:#dfdad1 !important;border-top-width:0px !important;border-right-width:0px !important;border-bottom-width:1px !important;border-left-width:0px !important;padding-bottom:24px !important;}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-cafb410 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"cafb410\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-cafb410-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-cafb410-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-7587441\" data-block-id=\"7587441\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-1ff4186\" id=\"when-engineering-reduces-industrial-risk\" data-block-id=\"1ff4186\"><h2 class=\"stk-block-heading__text\">When engineering reduces industrial risk<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-bc76fc9\" data-block-id=\"bc76fc9\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><linearGradient id=\"linear-gradient-bc76fc9\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-bc-76-fc-9-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-bc-76-fc-9-color-2)\"><\/stop><\/linearGradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewBox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-87142cc stk-block-accordion__content\" data-v=\"4\" data-block-id=\"87142cc\"><style>.stk-87142cc-container{padding-top:0px !important;padding-right:0px !important;padding-bottom:0px !important;padding-left:0px !important;}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-87142cc-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-87142cc-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-0bc4230\" data-block-id=\"0bc4230\"><p class=\"stk-block-text__text\">Advanced photonics projects rarely fail for scientific reasons.<\/p><\/div>\n\n\n\n<p class=\"wp-block-paragraph\">They fail during the transition to industrialization.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">A custom-built optical bench then becomes much more than a measuring instrument: it serves as a strategic lever that enables you to:<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Transfer innovations to production in a controlled manner.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Qualify materials early in the process,<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Reduce process risks,<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Secure substrate investments,<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Accelerate time-to-market,<\/p>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<h2 class=\"wp-block-heading\">PIS\u00c9O, a partner in the industrialization of photonic technologies<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Transforming a scientific innovation into a sustainable industrial advantage requires much more than just optical expertise. It requires a combined mastery of optics, precision mechanics, and systems engineering.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">This is precisely the role that PIS\u00c9O plays for its industrial partners: designing, securing, and industrializing complex optical systems capable of operating reliably in demanding environments.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Choosing PIS\u00c9O means relying on a partner capable of transforming laboratory-based technology into operational, robust, and durable industrial equipment.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Industrializing advanced photonic metrology How PIS\u00c9O transforms a laboratory setup into reliable industrial equipment for Non-Destructive Testing In the semiconductor and integrated photonics industries, a component\u2019s final performance depends directly on the quality of the material used. When a crystal defect is detected too late, after costly manufacturing steps, the industrial losses become irrecoverable. Identifying [&hellip;]<\/p>\n","protected":false},"author":171492485,"featured_media":30476,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_uag_custom_page_level_css":"","footnotes":""},"categories":[7015,7009,7005,7004,7007],"tags":[],"class_list":["post-30463","post","type-post","status-publish","format-standard","has-post-thumbnail","category-industry-4-0-posts","category-markets-posts","category-optical-benches","category-optical-consulting-engineering-posts","category-our-projects"],"featured_image_src":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","author_info":{"display_name":"piseophotonics","author_link":"https:\/\/piseo.fr\/en\/author\/piseophotonics\/"},"featured_image_urls_v2":{"full":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg",2560,1440,false],"thumbnail":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-150x150.jpg",150,150,true],"medium":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"medium_large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-768x432.jpg",696,392,true],"large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1024x576.jpg",696,392,true],"1536x1536":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1536x864.jpg",1536,864,true],"2048x2048":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-2048x1152.jpg",2048,1152,true],"td_150x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-150x84.jpg",150,84,true],"td_150x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"td_218x150":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-218x150.jpg",218,150,true],"td_218x150_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-436x300.jpg",436,300,true],"td_300x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"td_300x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x338.jpg",600,338,true],"td_324x400":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-324x400.jpg",324,400,true],"td_324x400_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-648x800.jpg",648,800,true],"td_485x360":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-485x360.jpg",485,360,true],"td_485x360_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-970x720.jpg",970,720,true],"td_696x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-696x392.jpg",696,392,true],"td_696x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1392x783.jpg",1392,783,true],"td_1068x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1068x601.jpg",1068,601,true],"td_1068x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-2136x1202.jpg",2136,1202,true],"td_1920x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1920x1080.jpg",1920,1080,true],"td_1920x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-3840x2160.jpg",3840,2160,true],"ultp_layout_landscape_large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1200x800.jpg",1200,800,true],"ultp_layout_landscape":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-870x570.jpg",870,570,true],"ultp_layout_portrait":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x900.jpg",600,900,true],"ultp_layout_square":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x600.jpg",600,600,true]},"post_excerpt_stackable_v2":"<p>Industrializing advanced photonic metrology How PIS\u00c9O transforms a laboratory setup into reliable industrial equipment for Non-Destructive Testing In the semiconductor and integrated photonics industries, a component\u2019s final performance depends directly on the quality of the material used. When a crystal defect is detected too late, after costly manufacturing steps, the industrial losses become irrecoverable. Identifying these defects early on is therefore a major strategic challenge. However, this requires a measurement system capable of moving beyond the experimental framework to become a reliable, reproducible and usable tool in an industrial environment. It is precisely at this critical juncture, the transition from&hellip;<\/p>\n","category_list_v2":"<a href=\"https:\/\/piseo.fr\/en\/markets-posts\/industry-4-0-posts\/\" rel=\"category tag\">Industry 4.0<\/a>, <a href=\"https:\/\/piseo.fr\/en\/markets-posts\/\" rel=\"category tag\">Markets<\/a>, <a href=\"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/optical-benches\/\" rel=\"category tag\">Optical benches<\/a>, <a href=\"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/\" rel=\"category tag\">Optical consulting and engineering<\/a>, <a href=\"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/our-projects\/\" rel=\"category tag\">Our projects<\/a>","author_info_v2":{"name":"piseophotonics","url":"https:\/\/piseo.fr\/en\/author\/piseophotonics\/"},"comments_num_v2":"0 comments","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.8 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Non-linear optical metrology 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class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/\"},\"author\":{\"name\":\"piseophotonics\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#\\\/schema\\\/person\\\/d8c9a982b00ab2f68000c47b85f80f94\"},\"headline\":\"Non-linear optical metrology bench\",\"datePublished\":\"2026-04-24T08:05:32+00:00\",\"dateModified\":\"2026-04-24T09:09:28+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/\"},\"wordCount\":738,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/banc-optique-1-scaled.jpg\",\"articleSection\":[\"Industry 4.0\",\"Markets\",\"Optical benches\",\"Optical consulting and engineering\",\"Our projects\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/\",\"url\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/\",\"name\":\"Non-linear optical metrology bench - PIS\u00c9O\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/banc-optique-1-scaled.jpg\",\"datePublished\":\"2026-04-24T08:05:32+00:00\",\"dateModified\":\"2026-04-24T09:09:28+00:00\",\"description\":\"PIS\u00c9O transforms a laboratory setup into reliable industrial equipment (optical metrology bench) for Non-Destructive Testing\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#primaryimage\",\"url\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/banc-optique-1-scaled.jpg\",\"contentUrl\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/banc-optique-1-scaled.jpg\",\"width\":2560,\"height\":1440,\"caption\":\"optical bench\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/optical-consulting-engineering-posts\\\/non-linear-optical-metrology-bench\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/piseo.fr\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Non-linear optical metrology bench\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#website\",\"url\":\"https:\\\/\\\/piseo.fr\\\/en\\\/\",\"name\":\"PIS\u00c9O\",\"description\":\"Design and Characterization of Innovative Optical Systems\",\"publisher\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/piseo.fr\\\/en\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#organization\",\"name\":\"PIS\u00c9O\",\"url\":\"https:\\\/\\\/piseo.fr\\\/en\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2022\\\/03\\\/PISEO-Logo-RVB.png\",\"contentUrl\":\"https:\\\/\\\/piseo.fr\\\/wp-content\\\/uploads\\\/2022\\\/03\\\/PISEO-Logo-RVB.png\",\"width\":1772,\"height\":682,\"caption\":\"PIS\u00c9O\"},\"image\":{\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\"},\"sameAs\":[\"https:\\\/\\\/www.linkedin.com\\\/company\\\/piseo\\\/?originalSubdomain=fr\"]},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/piseo.fr\\\/en\\\/#\\\/schema\\\/person\\\/d8c9a982b00ab2f68000c47b85f80f94\",\"name\":\"piseophotonics\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g\",\"caption\":\"piseophotonics\"},\"sameAs\":[\"http:\\\/\\\/piseofr.wordpress.com\"],\"url\":\"https:\\\/\\\/piseo.fr\\\/en\\\/author\\\/piseophotonics\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Non-linear optical metrology bench - PIS\u00c9O","description":"PIS\u00c9O transforms a laboratory setup into reliable industrial equipment (optical metrology bench) for Non-Destructive Testing","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/","og_locale":"en_US","og_type":"article","og_title":"Non-linear optical metrology bench - PIS\u00c9O","og_description":"PIS\u00c9O transforms a laboratory setup into reliable industrial equipment (optical metrology bench) for Non-Destructive Testing","og_url":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/","og_site_name":"PIS\u00c9O","article_published_time":"2026-04-24T08:05:32+00:00","article_modified_time":"2026-04-24T09:09:28+00:00","og_image":[{"width":2560,"height":1440,"url":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","type":"image\/jpeg"}],"author":"piseophotonics","twitter_card":"summary_large_image","twitter_misc":{"Written by":"piseophotonics","Est. reading time":"4 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#article","isPartOf":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/"},"author":{"name":"piseophotonics","@id":"https:\/\/piseo.fr\/en\/#\/schema\/person\/d8c9a982b00ab2f68000c47b85f80f94"},"headline":"Non-linear optical metrology bench","datePublished":"2026-04-24T08:05:32+00:00","dateModified":"2026-04-24T09:09:28+00:00","mainEntityOfPage":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/"},"wordCount":738,"commentCount":0,"publisher":{"@id":"https:\/\/piseo.fr\/en\/#organization"},"image":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#primaryimage"},"thumbnailUrl":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","articleSection":["Industry 4.0","Markets","Optical benches","Optical consulting and engineering","Our projects"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/","url":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/","name":"Non-linear optical metrology bench - PIS\u00c9O","isPartOf":{"@id":"https:\/\/piseo.fr\/en\/#website"},"primaryImageOfPage":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#primaryimage"},"image":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#primaryimage"},"thumbnailUrl":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","datePublished":"2026-04-24T08:05:32+00:00","dateModified":"2026-04-24T09:09:28+00:00","description":"PIS\u00c9O transforms a laboratory setup into reliable industrial equipment (optical metrology bench) for Non-Destructive Testing","breadcrumb":{"@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#primaryimage","url":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","contentUrl":"https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg","width":2560,"height":1440,"caption":"optical bench"},{"@type":"BreadcrumbList","@id":"https:\/\/piseo.fr\/en\/optical-consulting-engineering-posts\/non-linear-optical-metrology-bench\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/piseo.fr\/en\/"},{"@type":"ListItem","position":2,"name":"Non-linear optical metrology bench"}]},{"@type":"WebSite","@id":"https:\/\/piseo.fr\/en\/#website","url":"https:\/\/piseo.fr\/en\/","name":"PIS\u00c9O","description":"Design and Characterization of Innovative Optical Systems","publisher":{"@id":"https:\/\/piseo.fr\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/piseo.fr\/en\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/piseo.fr\/en\/#organization","name":"PIS\u00c9O","url":"https:\/\/piseo.fr\/en\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/piseo.fr\/en\/#\/schema\/logo\/image\/","url":"https:\/\/piseo.fr\/wp-content\/uploads\/2022\/03\/PISEO-Logo-RVB.png","contentUrl":"https:\/\/piseo.fr\/wp-content\/uploads\/2022\/03\/PISEO-Logo-RVB.png","width":1772,"height":682,"caption":"PIS\u00c9O"},"image":{"@id":"https:\/\/piseo.fr\/en\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/www.linkedin.com\/company\/piseo\/?originalSubdomain=fr"]},{"@type":"Person","@id":"https:\/\/piseo.fr\/en\/#\/schema\/person\/d8c9a982b00ab2f68000c47b85f80f94","name":"piseophotonics","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/secure.gravatar.com\/avatar\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/1a31f1b561b50adbd680676ff38e3e8a5adac81258e64c1c2efd1f5ba803ab0a?s=96&d=identicon&r=g","caption":"piseophotonics"},"sameAs":["http:\/\/piseofr.wordpress.com"],"url":"https:\/\/piseo.fr\/en\/author\/piseophotonics\/"}]}},"uagb_featured_image_src":{"full":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-scaled.jpg",2560,1440,false],"thumbnail":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-150x150.jpg",150,150,true],"medium":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"medium_large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-768x432.jpg",696,392,true],"large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1024x576.jpg",696,392,true],"1536x1536":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1536x864.jpg",1536,864,true],"2048x2048":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-2048x1152.jpg",2048,1152,true],"td_150x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-150x84.jpg",150,84,true],"td_150x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"td_218x150":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-218x150.jpg",218,150,true],"td_218x150_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-436x300.jpg",436,300,true],"td_300x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-300x169.jpg",300,169,true],"td_300x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x338.jpg",600,338,true],"td_324x400":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-324x400.jpg",324,400,true],"td_324x400_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-648x800.jpg",648,800,true],"td_485x360":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-485x360.jpg",485,360,true],"td_485x360_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-970x720.jpg",970,720,true],"td_696x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-696x392.jpg",696,392,true],"td_696x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1392x783.jpg",1392,783,true],"td_1068x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1068x601.jpg",1068,601,true],"td_1068x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-2136x1202.jpg",2136,1202,true],"td_1920x0":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1920x1080.jpg",1920,1080,true],"td_1920x0_retina":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-3840x2160.jpg",3840,2160,true],"ultp_layout_landscape_large":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-1200x800.jpg",1200,800,true],"ultp_layout_landscape":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-870x570.jpg",870,570,true],"ultp_layout_portrait":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x900.jpg",600,900,true],"ultp_layout_square":["https:\/\/piseo.fr\/wp-content\/uploads\/2026\/04\/banc-optique-1-600x600.jpg",600,600,true]},"uagb_author_info":{"display_name":"piseophotonics","author_link":"https:\/\/piseo.fr\/en\/author\/piseophotonics\/"},"uagb_comment_info":0,"uagb_excerpt":"Industrializing advanced photonic metrology How PIS\u00c9O transforms a laboratory setup into reliable industrial equipment for Non-Destructive Testing In the semiconductor and integrated photonics industries, a component\u2019s final performance depends directly on the quality of the material used. When a crystal defect is detected too late, after costly manufacturing steps, the industrial losses become irrecoverable. Identifying&hellip;","_links":{"self":[{"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/posts\/30463","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/users\/171492485"}],"replies":[{"embeddable":true,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/comments?post=30463"}],"version-history":[{"count":7,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/posts\/30463\/revisions"}],"predecessor-version":[{"id":30485,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/posts\/30463\/revisions\/30485"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/media\/30476"}],"wp:attachment":[{"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/media?parent=30463"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/categories?post=30463"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/piseo.fr\/en\/wp-json\/wp\/v2\/tags?post=30463"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}